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Dr. T.P. MA
Director of Yale Center for Microelectronics, Yale University

  

He is Raymond J. Wean Professor of Electrical Engineering at Yale University, where he has been a faculty member since 1977. He also serves as the Director of Yale Center for Microelectronics, and a Co-Director of the Yale-Peking Joint Center for Microelectronics and Nanotechnology. He was Chairman of the Department of Electrical Engineering at Yale University between 1991 and 1995, and between 2001 and 2007. His research and teaching at Yale have focused on semiconductors, MOS interface physics, ionizing radiation and hot electron effects, advanced gate dielectrics, flash memory device physics, and ferroelectric thin films for memory applications.

In 1974 he graduated from Yale University with a Ph.D. degree and went to IBM, where he did research work on advanced silicon device technology and ionizing radiation effects in MOS devices before he joined Yale University faculty in 1977.

He is a patent holder, co-editor of a book, has given numerous invited talks and contributed to several book chapters as well as over 200 research papers. He has been actively involved in organizing, chairing, or serving as committee members in numerous technical conferences, including the IEEE/SISC, IEEE/DRC, IEEE/NSREC, International VLSI-TSA, SSDM, EDMS, ECS, and MRS meetings.

He has received the 2008 Connecticut Medal of Technology, the 2006 SIA (Semiconductor Industry Association) University Researcher Award, the 2005 IEEE Andrew S. Grove Award, a 2005 Pan Wen-Yuan Research Award, a 1998 IEEE EDS Paul Rappaport Award, two B.F. Goodrich National Collegiate Inventor's Advisor Awards in 1993 and 1998, respectively, the 1991 Connecticut Yankee Ingenuity Award, and the 1975 Harding Bliss Prize at Yale University.

He holds Honorary Professorship at Tianjin University and the Chinese Academy of Sciences, and Honorary Guest Professorship at Peking University and Tsinghua University, as well as Advisory Professorship at Fudan University..

He is a member of the National Academy of Engineering (NAE) in USA, a Fellow of IEEE, a Member of the Connecticut Academy of Science and Engineering (CASE), a life member of the American Physical Society, and a member of the ECS, MRS, Sigma Xi, and Yale Science and Engineering Association (YSEA).

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